DocumentCode
893106
Title
On the self-learning scheme of Nagy and Shelton
Author
Ho, Y. ; Agrawala, A.K.
Volume
55
Issue
10
fYear
1967
Firstpage
1764
Lastpage
1765
Abstract
A theoretical pattern recognition model is constructed to explain a experimental self-corrective character recognition scheme which was recently described.
Keywords
Character recognition; Convergence; Covariance matrix; Eigenvalues and eigenfunctions; Equations; NASA; Pattern analysis; Pattern recognition; Physics;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1967.5994
Filename
1447924
Link To Document