Title :
On the self-learning scheme of Nagy and Shelton
Author :
Ho, Y. ; Agrawala, A.K.
Abstract :
A theoretical pattern recognition model is constructed to explain a experimental self-corrective character recognition scheme which was recently described.
Keywords :
Character recognition; Convergence; Covariance matrix; Eigenvalues and eigenfunctions; Equations; NASA; Pattern analysis; Pattern recognition; Physics;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1967.5994
