Title :
Robust Blind Beamforming Algorithm Using Joint Multiple Matrix Diagonalization
Author :
Huang, Xiaozhou ; Wu, Hsiao-Chun ; Principe, Jose C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA
Abstract :
The objective of the blind beamforming is to restore the unknown source signals simply based on the observations, without a priori knowledge of the source signals and the mixing matrix. In this paper, we propose a new joint multiple matrix diagonalization (JMMD) algorithm for the robust blind beamforming. This new JMMD algorithm is based on the iterative eigen decomposition of the fourth-order cumulant matrices. Therefore, it can avoid the problems of the stability and the misadjustment, which arise from the conventional steepest-descent approaches for the constant-modulus or cumulant optimization. Our Monte Carlo simulations show that our proposed algorithm significantly outperforms the ubiquitous joint approximate diagonalization of eigen-matrices algorithm, relying on the Givens rotations for the phase-shift keying source signals in terms of signal-to-interference-and-noise ratio for a wide variety of signal-to-noise ratios
Keywords :
Monte Carlo methods; array signal processing; blind source separation; eigenvalues and eigenfunctions; matrix algebra; Monte Carlo simulations; constant-modulus; cumulant optimization; fourth-order cumulant matrices; givens rotation; higher order statistics; iterative eigen decomposition; joint multiple matrix diagonalization; phase-shift keying source signals; robust blind beamforming algorithm; signal-to-interference-and-noise ratio; signal-to-noise ratios; Antenna arrays; Array signal processing; Digital communication; Iterative algorithms; Laboratories; Matrix decomposition; Robustness; Sensor arrays; Signal processing; Vectors; Blind beamforming; cumulants; givens rotation; higher order statistics (HOS); joint approximate diagonalization of eigen-matrices (JADE); joint diagonalization; singular value decomposition (SVD);
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2006.886881