DocumentCode
893149
Title
A 35 ns 16K NMOS static RAM
Author
Anami, Kenji ; Yoshimoto, Masahiko ; Shinohara, Hirofumi ; Hirata, Yoshihiro ; Harada, Hiroshi ; Nakano, Takao
Volume
17
Issue
5
fYear
1982
Firstpage
815
Lastpage
820
Abstract
An NMOS 16K/spl times/1 bit fully static MOS RAM with 35 ns access time has been successfully developed. High speed access time was achieved by the combination of an NMOS process with the 2.2 /spl mu/m gate length transistor, high speed sense amplifier, and reduction on delay time at the crossunder. The improvements of row and column decoder circuits result in the low active and standby power dissipation of 275 mW and 22.5 mW, respectively. The soft error rate of the poly load cell was minimized by reducing the collection efficiency of alpha-particle induced electrons.
Keywords
Field effect integrated circuits; field effect integrated circuits; CMOS technology; Circuits; Conductivity; Decoding; Delay effects; Large scale integration; MOS devices; Optical amplifiers; Power dissipation;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1982.1051824
Filename
1051824
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