• DocumentCode
    893149
  • Title

    A 35 ns 16K NMOS static RAM

  • Author

    Anami, Kenji ; Yoshimoto, Masahiko ; Shinohara, Hirofumi ; Hirata, Yoshihiro ; Harada, Hiroshi ; Nakano, Takao

  • Volume
    17
  • Issue
    5
  • fYear
    1982
  • Firstpage
    815
  • Lastpage
    820
  • Abstract
    An NMOS 16K/spl times/1 bit fully static MOS RAM with 35 ns access time has been successfully developed. High speed access time was achieved by the combination of an NMOS process with the 2.2 /spl mu/m gate length transistor, high speed sense amplifier, and reduction on delay time at the crossunder. The improvements of row and column decoder circuits result in the low active and standby power dissipation of 275 mW and 22.5 mW, respectively. The soft error rate of the poly load cell was minimized by reducing the collection efficiency of alpha-particle induced electrons.
  • Keywords
    Field effect integrated circuits; field effect integrated circuits; CMOS technology; Circuits; Conductivity; Decoding; Delay effects; Large scale integration; MOS devices; Optical amplifiers; Power dissipation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1982.1051824
  • Filename
    1051824