DocumentCode :
893216
Title :
Impact of finite frequency deviation on the performance of dual-filter heterodyne FSK lightwave systems
Author :
Tonguz, Ozan K. ; Tanrikulu, M. Okan ; Kazovsky, Leonid G.
Author_Institution :
Dept. of Electr. & Comput. Eng., State University of New York, Buffalo, NY, USA
Volume :
11
Issue :
2
fYear :
1993
fDate :
2/1/1993 12:00:00 AM
Firstpage :
316
Lastpage :
330
Abstract :
A detailed theoretical analysis is given of the impact of finite frequency deviation on the sensitivity of dual-filter heterodyne frequency-shift-keying (FSK) lightwave systems. The analysis provides closed-form signal-to-noise ratio (SNR) results for estimating the bit-error-ratio (BER) performance of the system. These closed-form results provide an insight into the impact of finite frequency deviation 2Δfd, laser linewidth Δν, bit rate Rb, and IF filter bandwidths on the system performance. Simulation results indicate that the accuracy of the approximate theory presented is within 1 dB for linewidths up to 22% when BER=10-9. It is shown that there is a well-defined relationship between the choice of frequency deviation and the tolerable amount of laser phase noise. The sensitivity degradation can be very severe for a fixed linewidth as the frequency deviation gets smaller
Keywords :
demodulation; frequency shift keying; optical links; optical modulation; optical receivers; semiconductor device noise; sensitivity; spectral line breadth; IF filter bandwidths; approximate theory; bit-error-ratio; closed-form; dual-filter heterodyne FSK lightwave systems; finite frequency deviation; fixed linewidth; frequency-shift-keying; laser diodes; laser linewidth; laser phase noise; optical receivers; sensitivity; sensitivity degradation; signal-to-noise ratio; system performance; Bandwidth; Bit error rate; Bit rate; Filters; Frequency shift keying; Laser theory; Performance analysis; Signal analysis; Signal to noise ratio; System performance;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.212544
Filename :
212544
Link To Document :
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