• DocumentCode
    893246
  • Title

    A storage-node-boosted RAM with word-line delay compensation

  • Author

    Fujishima, Kazuyasu ; Shimotori, Kazuhiro ; Ozaki, Hideyuki ; Nakano, Takao

  • Volume
    17
  • Issue
    5
  • fYear
    1982
  • Firstpage
    872
  • Lastpage
    876
  • Abstract
    A storage-node-boosted (SNB) RAM has been proposed and its advantages have been made clear for the VLSI memory. The new dynamic RAM architecture features the pulsed cell plates rather than the fixed potential cell plates, which stores 1.7 V/SUB DD/ for `H´ in the cell without any boosted clocks and compensates the word-line delay. The 1 kbit test array has been fabricated with a 2 /spl mu/m level design rule. It provides a signal charge level of over 300 fC and a speed-up of 20 ns in a reading operation compared with the fixed cell plate potential cell.
  • Keywords
    Field effect integrated circuits; field effect integrated circuits; Capacitance; Clocks; DRAM chips; Delay; Random access memory; Read-write memory; Signal detection; Testing; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1982.1051833
  • Filename
    1051833