DocumentCode
893246
Title
A storage-node-boosted RAM with word-line delay compensation
Author
Fujishima, Kazuyasu ; Shimotori, Kazuhiro ; Ozaki, Hideyuki ; Nakano, Takao
Volume
17
Issue
5
fYear
1982
Firstpage
872
Lastpage
876
Abstract
A storage-node-boosted (SNB) RAM has been proposed and its advantages have been made clear for the VLSI memory. The new dynamic RAM architecture features the pulsed cell plates rather than the fixed potential cell plates, which stores 1.7 V/SUB DD/ for `H´ in the cell without any boosted clocks and compensates the word-line delay. The 1 kbit test array has been fabricated with a 2 /spl mu/m level design rule. It provides a signal charge level of over 300 fC and a speed-up of 20 ns in a reading operation compared with the fixed cell plate potential cell.
Keywords
Field effect integrated circuits; field effect integrated circuits; Capacitance; Clocks; DRAM chips; Delay; Random access memory; Read-write memory; Signal detection; Testing; Very large scale integration; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1982.1051833
Filename
1051833
Link To Document