Title :
A programmable instrumentation amplifier for 12-bit resolution systems
Author :
Wurcer, Scott A. ; Counts, Lewis W.
Abstract :
Describes the design of and experimental results obtained from a monolithic gain-programmable instrumentation amplifier that attains performance compatible with 12-bit or higher resolution data acquisition systems. Nonlinearity is held to a 0.01 percent worst-case level over the -25 to 85/spl deg/C temperature range for gains of 1-1000, independent of process variations. Input and output voltage noise and offset drift are also reduced to low levels. A novel input overvoltage protection scheme is also described. The amplifier is fabricated on a standard-beta junction isolated bipolar process that has in addition process-compatible ion implanted JFETs and silicon-chromium thin-film resistors.
Keywords :
Monolithic integrated circuits; Operational amplifiers; Thin film resistors; monolithic integrated circuits; operational amplifiers; thin film resistors; Data acquisition; Instruments; JFETs; Noise level; Noise reduction; Protection; Resistors; Semiconductor thin films; Temperature distribution; Voltage control;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1982.1051867