• DocumentCode
    893728
  • Title

    Sensitivity analysis of scattering parameters with electromagnetic time-domain simulators

  • Author

    Nikolova, Natalia K. ; Li, Ying ; Li, Yan ; Bakr, Mohamed H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
  • Volume
    54
  • Issue
    4
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    1598
  • Lastpage
    1610
  • Abstract
    We propose an efficient adjoint-variable approach to the sensitivity analysis of S-parameters obtained from full-wave electromagnetic (EM) time-domain simulations. It allows the computation of the S-parameter derivatives with respect to the design variables with negligible overhead. No solutions of adjoint EM problems are needed. The computation is done as an independent post-process outside the solver. The sole requirement is the ability of the solver to export the field solution at user-defined points. Most commercial solvers have this ability, which makes our approach readily applicable to practical design problems. The approach is verified through the analysis of waveguide and antenna structures using commercial simulators.
  • Keywords
    S-parameters; computational electromagnetics; sensitivity analysis; time-domain analysis; transmission line matrix methods; S-parameters; adjoint-variable approach; antenna structures; design automation; full wave electromagnetic time-domain simulations; sensitivity analysis; time-domain analysis; waveguide analysis; Analytical models; Computational modeling; Electromagnetic scattering; Electromagnetic waveguides; Finite difference methods; Scattering parameters; Sensitivity analysis; Time domain analysis; Transmission line matrix methods; Transmission lines; Adjoint-variable methods; design automation; finite-difference time-domain (FDTD) method; sensitivity analysis; time-domain analysis; transmission-line matrix method (TLM);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2006.871350
  • Filename
    1618581