DocumentCode :
893737
Title :
Small area high purity germanium detectors for use in the energy range 100 eV to 100 keV
Author :
Cox, C.E. ; Lowe, B.G. ; Sareen, R.A.
Author_Institution :
Link Anal. Ltd., High Wycombe, UK
Volume :
35
Issue :
1
fYear :
1988
Firstpage :
28
Lastpage :
32
Abstract :
The performance of small-area high-purity germanium detectors used to detect X-rays in the energy range from 100 eV to 100 keV is discussed. The response at low, medium and high energies, the variation of detector performance with high voltage bias, and radiation hardness are covered. Good spectrum line shapes have been achieved even at ultralow energies. These detectors are intended for X-ray microanalysis in electron microscopes, where they offer the advantages of good high-energy detection efficiency, lower noise, and higher energy resolution compared to the conventional lithium-drifted silicon detector.<>
Keywords :
X-ray detection and measurement; semiconductor counters; 100 eV to 100 keV; Ge detector; X-ray microanalysis; X-rays; electron microscopes; high voltage bias; higher energy resolution; lower noise; radiation hardness; small-area high-purity; spectrum line shapes; ultralow energies; Electron microscopy; Energy resolution; Germanium; Noise shaping; Radiation detectors; Shape; Silicon; Voltage; X-ray detection; X-ray detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.12667
Filename :
12667
Link To Document :
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