DocumentCode :
893794
Title :
A High-Resolution Swept-Frequency Reflectometer
Author :
Hollway, D.L. ; Somlo, P.I.
Volume :
17
Issue :
4
fYear :
1969
fDate :
4/1/1969 12:00:00 AM
Firstpage :
185
Lastpage :
188
Abstract :
A simple swept-frequency reflectometer is described that is capable of measuring reflection coefficients as low as 0.001 and is particularly suitable for precise impedance matching. With the exception of a length of accurate plain waveguide, used as a standard, the instrument contains no critical components and requires no tuning adjustments. The reflection coefficient is displayed on an oscilloscope or X-Y recorder on an almost linear scale that is only slightly affected by departures from square-law detection.
Keywords :
Detectors; Directional couplers; Displays; Frequency; Impedance measurement; Instruments; Interference; Oscilloscopes; Particle measurements; Reflection;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1969.1126930
Filename :
1126930
Link To Document :
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