DocumentCode
893794
Title
A High-Resolution Swept-Frequency Reflectometer
Author
Hollway, D.L. ; Somlo, P.I.
Volume
17
Issue
4
fYear
1969
fDate
4/1/1969 12:00:00 AM
Firstpage
185
Lastpage
188
Abstract
A simple swept-frequency reflectometer is described that is capable of measuring reflection coefficients as low as 0.001 and is particularly suitable for precise impedance matching. With the exception of a length of accurate plain waveguide, used as a standard, the instrument contains no critical components and requires no tuning adjustments. The reflection coefficient is displayed on an oscilloscope or X-Y recorder on an almost linear scale that is only slightly affected by departures from square-law detection.
Keywords
Detectors; Directional couplers; Displays; Frequency; Impedance measurement; Instruments; Interference; Oscilloscopes; Particle measurements; Reflection;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1969.1126930
Filename
1126930
Link To Document