DocumentCode :
893953
Title :
Circuit for testing high-efficiency IMPATT diodes
Author :
Iglesias, D.E.
Volume :
55
Issue :
11
fYear :
1967
Firstpage :
2065
Lastpage :
2066
Abstract :
A high-performance IMPATT diode test circuit has been developed which is very effective in reducing spurious oscillations. In this circuit, a 6-GHz germanium diode has been tested at 12.1-percent CW efficiency and 0.620-watt output.
Keywords :
Circuit optimization; Circuit testing; Current density; Diodes; Electric breakdown; Heat sinks; Insertion loss; Laboratories; Tuning; Water heating;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1967.6077
Filename :
1448007
Link To Document :
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