DocumentCode :
894028
Title :
All-refractory Josephson logic circuits
Author :
Jillie, Don ; Smith, Lawrence N. ; Kroger, Harry ; Currier, Louis W. ; Payer, Robert L. ; Potter, Curtis ; Shaw, Dale M.
Volume :
18
Issue :
2
fYear :
1983
fDate :
4/1/1983 12:00:00 AM
Firstpage :
173
Lastpage :
180
Abstract :
A process for the fabrication of Josephson integrated circuits is described which uses only refractory materials. The Josephson devices are Nb-Si-Nb tunnel junctions which are formed in the initial phase of the process. After depositing a Nb-Si-Nb `trilayer´ over the entire substrate, the individual devices are isolated by the selective niobium anodization process (SNAP). Other materials used are molybdenum for the normal resistors and bias-sputtered SiO/SUB 2/ for additional insulator layers. The process uses only five photolithographic steps to produce circuits of the direct-coupled isolation type. This simplicity is achieved by using some layers for multiple purposes and by fabricating components with different functional purposes in a single step. For example, the lower electrode of the Josephson devices also functions as the ground plane and the contacts to the ground plane are actually large-area Josephson junctions formed simultaneously with the active devices. Low capacitance junctions (~0.025 pF//spl mu/m/SUP 2/) are produced with good uniformity.
Keywords :
Integrated circuit technology; Integrated logic circuits; Josephson effect; Superconducting junction devices; integrated circuit technology; integrated logic circuits; superconducting junction devices; Fabrication; Insulation; Integrated circuit technology; Josephson junctions; Niobium; Reproducibility of results; Resistors; Resists; Robustness; Superconducting devices;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1983.1051919
Filename :
1051919
Link To Document :
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