Title :
A high-density MOS static RAM cell using the lambda bipolar transistor
fDate :
4/1/1983 12:00:00 AM
Abstract :
Based upon the common-collector lambda bipolar transistor (LBT), which is built with p-well NMOS, and the parasitic n-p-n BJT in a CMOS IC, a novel MOS static RAM cell called the LBT cell is proposed. In this new cell, the LBT and two poly-Si resistors form a bistable element with a PMOS access transistor. With the minimum feature size F, the optimal cell area of 32 F/SUP 2/ can be realized by using the silicide contact and small p-well spacing. The READ-WRITE operation is simulated. Due to the need of precharging before reading and the rather slow recovery after reading, suitable peripheral circuits should be designed.
Keywords :
Field effect integrated circuits; Integrated circuit technology; Integrated memory circuits; Random-access storage; field effect integrated circuits; integrated circuit technology; integrated memory circuits; random-access storage; Bipolar integrated circuits; Bipolar transistors; CMOS technology; Circuit simulation; MOS devices; MOSFET circuits; Random access memory; Read-write memory; Resistors; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1983.1051926