Title :
Comment on: Extension of the Duane Plotting Technique
Author :
Florescu, Radu A.
Author_Institution :
Telrad Telecommunication and Electronic Industries Ltd., Lod
Keywords :
Electronics industry; Failure analysis; Histograms; Linearity; Probability; Reliability engineering; Shape; Statistical analysis; Statistics; Testing;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1986.4335495
