DocumentCode :
894298
Title :
On microwave methods for the measurement of effective mass of carriers in semiconductors
Author :
Nag, B.R. ; Datta, A.N.
Volume :
55
Issue :
12
fYear :
1967
Firstpage :
2178
Lastpage :
2179
Abstract :
Available microwave methods for the measurement of effective mass of carriers in semiconductors are discussed and two other possible methods using only microwave data and requiring no assumption about the energy dependence of the momentum relaxation time of the carriers are suggested.
Keywords :
Anisotropic magnetoresistance; Conductivity; Conductors; Dielectric constant; Effective mass; Equations; Magnetic fields; Microwave measurements; Microwave theory and techniques; Tensile stress;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1967.6112
Filename :
1448042
Link To Document :
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