Title :
Comparison of the neutron radiation tolerance of bipolar and junction field effect transistors
Author :
Buchanan, B. ; Dolan, R. ; Roosild, S.
Abstract :
The radiation tolerance is defined to be the integrated neutron flux required to reduce the transconductance or common emitter current gain by a tolerable reduction factor. Using this definition, simplified gain models, and empirical data, general expressions are derived and comparisons made which indicate that the junction field effect transistor is inherently more radiation tolerant than the bipolar.
Keywords :
Bipolar transistors; Charge carrier lifetime; Doping; Equations; FETs; Gain measurement; Genetic expression; Integrated circuit measurements; Neutrons; Silicon;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1967.6119