DocumentCode :
894372
Title :
Comparison of the neutron radiation tolerance of bipolar and junction field effect transistors
Author :
Buchanan, B. ; Dolan, R. ; Roosild, S.
Volume :
55
Issue :
12
fYear :
1967
Firstpage :
2188
Lastpage :
2189
Abstract :
The radiation tolerance is defined to be the integrated neutron flux required to reduce the transconductance or common emitter current gain by a tolerable reduction factor. Using this definition, simplified gain models, and empirical data, general expressions are derived and comparisons made which indicate that the junction field effect transistor is inherently more radiation tolerant than the bipolar.
Keywords :
Bipolar transistors; Charge carrier lifetime; Doping; Equations; FETs; Gain measurement; Genetic expression; Integrated circuit measurements; Neutrons; Silicon;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1967.6119
Filename :
1448049
Link To Document :
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