Title :
A macromodel for integrated all-MOS operational amplifiers
Author :
Turchetti, Claudio ; Masetti, Guido
Abstract :
A macromodel for integrated all-MOS operational amplifiers is developed with reference to circuits where the settling behavior of the op amps is of particular concern. Expressions for the values of the elements of the macromodel are obtained from typical measured characteristics. It is shown that the proposed macromodel can satisfactorily predict both small-signal and large-signal behavior of the op amps.
Keywords :
Field effect integrated circuits; Linear integrated circuits; Operational amplifiers; Semiconductor device models; field effect integrated circuits; linear integrated circuits; operational amplifiers; semiconductor device models; Circuit simulation; Computational modeling; Computer simulation; FETs; Integrated circuit measurements; Operational amplifiers; Phase change materials; Switches; Switching circuits; Threshold voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1983.1051961
