DocumentCode :
894515
Title :
Foreword (October 1983)
Volume :
18
Issue :
5
fYear :
1983
Firstpage :
435
Lastpage :
436
Keywords :
Delay; Integrated circuit technology; Laboratories; Logic; MOS devices; Power dissipation; Random access memory; Read-write memory; Refining; Solid state circuits;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1983.1051973
Filename :
1051973
Link To Document :
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