Title :
A Stochastic Model for Availability Measure with Common-Cause Failures
Author :
Chari, A.Ananda Raja
Author_Institution :
Sri Venkateswara University Post-Graduate Centre, Kurnool
Keywords :
Hazards; Markov processes; Quality control; Steady-state; Stochastic processes;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1986.4335549
