• DocumentCode
    894941
  • Title

    A High-Resolution Method for Quantum Confinement Transport Simulations in MOSFETs

  • Author

    Odanaka, Shinji

  • Author_Institution
    Cybermedia Center, Osaka Univ.
  • Volume
    26
  • Issue
    1
  • fYear
    2007
  • Firstpage
    80
  • Lastpage
    85
  • Abstract
    This paper describes a new discretization scheme for quantum confinement transport simulations using a quantum drift-diffusion model. A high-resolution scheme is constructed by developing an exponential-fitting method with the slope limiter in a class of conservative schemes to simulate the flow of electrons with quantum confinement effects in MOSFETs. This method is reinterpreted as a flux-limiter method that hybridizes a low-order flux and a high-order flux into a single numerical flux. The discretization method provides good approximations to the density profile in the smooth regions and boundary layers of the electron flow and allows high-resolution simulations of quantum confinement transport in ultrasmall MOSFETs
  • Keywords
    MOSFET; numerical analysis; partial differential equations; semiconductor device models; MOSFET; electron flow; exponential-fitting method; high-order flux; high-resolution method; high-resolution scheme; low-order flux; numerical analysis; partial differential equation; quantum confinement effects; quantum drift-diffusion model; quantum theory; semiconductor device model; Charge carrier processes; Chemicals; Computational modeling; Electrons; MOSFETs; Nonlinear equations; Partial differential equations; Poisson equations; Potential well; Schrodinger equation; Numerical analysis; partial differential equation; quantum theory; semiconductor device model; simulation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2006.882531
  • Filename
    4039512