DocumentCode :
895258
Title :
On the error associated with the MIS method of capacitance measurement of surface state density
Author :
Juhasz, C.
Volume :
56
Issue :
2
fYear :
1968
Firstpage :
189
Lastpage :
190
Abstract :
The inherent error associated with the deduction of surface capacitance from measured MIS capacitance is considered. It is shown that the systematic component of the experimental error does not restrict the range of applications of the technique whereas any random contribution can invalidate the measurement in certain cases.
Keywords :
Ambient intelligence; Automatic control; Automation; Capacitance measurement; Equations; Estimation error; Filtering; National electric code; Pattern recognition; Stochastic processes;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1968.6214
Filename :
1448144
Link To Document :
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