Title :
On the error associated with the MIS method of capacitance measurement of surface state density
Abstract :
The inherent error associated with the deduction of surface capacitance from measured MIS capacitance is considered. It is shown that the systematic component of the experimental error does not restrict the range of applications of the technique whereas any random contribution can invalidate the measurement in certain cases.
Keywords :
Ambient intelligence; Automatic control; Automation; Capacitance measurement; Equations; Estimation error; Filtering; National electric code; Pattern recognition; Stochastic processes;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1968.6214
