DocumentCode
895258
Title
On the error associated with the MIS method of capacitance measurement of surface state density
Author
Juhasz, C.
Volume
56
Issue
2
fYear
1968
Firstpage
189
Lastpage
190
Abstract
The inherent error associated with the deduction of surface capacitance from measured MIS capacitance is considered. It is shown that the systematic component of the experimental error does not restrict the range of applications of the technique whereas any random contribution can invalidate the measurement in certain cases.
Keywords
Ambient intelligence; Automatic control; Automation; Capacitance measurement; Equations; Estimation error; Filtering; National electric code; Pattern recognition; Stochastic processes;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1968.6214
Filename
1448144
Link To Document