Title :
Cosmic Ray Induced Errors in I2L Microprocessors and Logic Devices
Author :
Price, W.E. ; Pickel, J.C. ; Ellis, T. ; Frazee, F.B.
Author_Institution :
Jet Propulsion Laboratory, Pasadena, California
Abstract :
Large scale integrated (LSI) devices fabricated with integrated injection logic (I2L) were studied by both heavy ion experiments asd device analysis to determine the upset threshold, the charge collection volumes and ultimately the probability for upset in the galactic cosmic ray spectrum. The devices studied, the SEP9900A, the SBP9989 and the P-Code generator were fabricated by Texas Instruments, Inc.
Keywords :
Circuit testing; Cranes; Laboratories; Large scale integration; Logic devices; Microprocessors; Propulsion; Space technology; Switches; Weapons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335653
