• DocumentCode
    895429
  • Title

    Single Event Upsets in NMOS Microprocessors

  • Author

    Guenzer, C.S. ; Campbell, A.B. ; Shapiro, P.

  • Author_Institution
    Naval Research Laboratory Washington, DC 20375
  • Volume
    28
  • Issue
    6
  • fYear
    1981
  • Firstpage
    3955
  • Lastpage
    3958
  • Abstract
    Three advanced 16-bit NMOS microprocessors have been observed to suffer single event upset at a rate varying between one upset for every 8 × 1010 to one for every 2 × 1012 n/cm2-upset for cyclotron-produced neutrons with an average energy of 14 MeV. These rates are expected to vary, probably upward, with different types of programs. The errors are inferred to occur in memory-like components of the microprocessors. Many of the errors caused the microcomputer to cease normal operations. This is the first direct experimental verification of logic upsets in microprocessors from neutrons.
  • Keywords
    Alpha particles; DRAM chips; Error correction; Logic devices; MOS devices; Microcomputers; Microprocessors; Neutrons; Random access memory; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4335654
  • Filename
    4335654
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=895429