Title :
Radiation Effects in a Virtual Phase CCD Imager
Author :
McGrath, R.Daniel
Author_Institution :
Interface Technology Laboratory Texas Instruments 13500 N. Central Expressway Dallas, Texas 75265
Abstract :
CCD imagers fabricated using a single gate process have been subjected to total dose ¿-ray exposures of 1 megarad. The devices are operational after the test. The effect of the radiation on the performance is discussed.
Keywords :
Charge coupled devices; Clocks; Instruments; Ionizing radiation; Laboratories; Lighting; Pixel; Radiation effects; Space technology; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335668
