• DocumentCode
    895630
  • Title

    SEM Analysis of Ionizing Radiation Effects in an Analog to Digital Converter (AD571)

  • Author

    Gauthier, Michael K. ; Perret, Jonathan ; Evans, Kenneth C.

  • Author_Institution
    JET Propulsion Laboratory California Institute of Technology 4800 Oak Grove Drive Pasadena, California 91109
  • Volume
    28
  • Issue
    6
  • fYear
    1981
  • Firstpage
    4051
  • Lastpage
    4055
  • Keywords
    Analog-digital conversion; Circuits; Electron beams; Ionizing radiation; Laboratories; Propulsion; Radiation hardening; Scanning electron microscopy; Space technology; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4335673
  • Filename
    4335673
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=895630