Title :
An experimental method for the determination of the saturation point of a MOSFET
Author :
Booth, Richard V H ; White, Marvin H.
Abstract :
This paper presents an extraction technique which determines the drain voltages and currents at saturation directly from experimental data. The technique makes use of both drain current and conductance data. In addition to V/SUB DSS/ and I/SUB DSS/, parameters for the characterization of the saturation region may be extracted via this technique.
Keywords :
Characteristics measurement; characteristics measurement; CMOS digital integrated circuits; Data mining; Hydrogen; MOSFET circuits; Operational amplifiers; Power amplifiers; Power dissipation; Predictive models; Semiconductor device modeling; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1984.1052094
