DocumentCode :
895749
Title :
A Power-Efficient High-Throughput 32-Thread SPARC Processor
Author :
Leon, Ana Sonia ; Tam, Kenway W. ; Shin, Jinuk Luke ; Weisner, David ; Schumacher, Francis
Author_Institution :
Sun Microsystems Inc, Sunnyvale, CA
Volume :
42
Issue :
1
fYear :
2007
Firstpage :
7
Lastpage :
16
Abstract :
This first generation of "Niagara" SPARC processors implements a power-efficient Chip Multi-Threading (CMT) architecture which maximizes overall throughput performance for commercial workloads. The target performance is achieved by exploiting high bandwidth rather than high frequency, thereby reducing hardware complexity and power. The UltraSPARC T1 processor combines eight four-threaded 64-b cores, a floating-point unit, a high-bandwidth interconnect crossbar, a shared 3-MB L2 Cache, four DDR2 DRAM interfaces, and a system interface unit. Power and thermal monitoring techniques further enhance CMT performance benefits, increasing overall chip reliability. The 378-mm2 die is fabricated in Texas Instrument\´s 90-nm CMOS technology with nine layers of copper interconnect. The chip contains 279 million transistors and consumes a maximum of 63 W at 1.2 GHz and 1.2 V. Key functional units employ special circuit techniques to provide the high bandwidth required by a CMT architecture while optimizing power and silicon area. These include a highly integrated integer register file, a high-bandwidth interconnect crossbar, the shared L2 cache, and the IO subsystem. Key aspects of the physical design methodology are also discussed
Keywords :
CMOS integrated circuits; DRAM chips; cache storage; copper; integrated circuit interconnections; integrated circuit reliability; low-power electronics; microprocessor chips; thermal management (packaging); 1.2 GHz; 1.2 V; 3 MByte; 63 W; 90 nm; CMOS technology; DDR2 DRAM interfaces; SPARC processor; UltraSPARC Tl processor; chip multi-threading architecture; chip reliability; copper interconnect; interconnect crossbar; power management; shared L2 cache; system interface unit; thermal management; Bandwidth; CMOS technology; Frequency; Hardware; Integrated circuit interconnections; Monitoring; Power generation; Power system interconnection; Random access memory; Throughput; Channel hot carrier (CHC); Chip Multi-Threading (CMT); DDR2; L2 cache; Negative Bias Temperature Instability (NBTI); Niagara processor; UltraSPARC T1; clock distribution; electromigration (EM); gate-oxide integrity (GOI); integer register file (IRF); interconnect crossbar; low power; multi-core; power management; reliability; static circuits; thermal management; throughput computing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2006.885049
Filename :
4039591
Link To Document :
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