DocumentCode :
895753
Title :
Robust and nonrobust path delay fault simulation by parallel processing of patterns
Author :
Fink, Franz ; Fuchs, Karl ; Schulz, Michael H.
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. of Munich, Germany
Volume :
41
Issue :
12
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
1527
Lastpage :
1536
Abstract :
An accelerated fault simulation approach for path delay faults is presented. The distinct features of the proposed fault simulation method consist in the application of parallel processing of patterns at all stages of the calculation procedure, its versatility to account for both robust and nonrobust decision of path delay faults, and its capability of efficiently maintaining large numbers of path faults to be simulated
Keywords :
circuit analysis computing; fault location; integrated circuit testing; many-valued logics; parallel processing; parallel processing; path delay fault simulation; patterns; Acceleration; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Parallel processing; Propagation delay; Robustness; Timing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.214661
Filename :
214661
Link To Document :
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