Title :
Robust and nonrobust path delay fault simulation by parallel processing of patterns
Author :
Fink, Franz ; Fuchs, Karl ; Schulz, Michael H.
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. of Munich, Germany
fDate :
12/1/1992 12:00:00 AM
Abstract :
An accelerated fault simulation approach for path delay faults is presented. The distinct features of the proposed fault simulation method consist in the application of parallel processing of patterns at all stages of the calculation procedure, its versatility to account for both robust and nonrobust decision of path delay faults, and its capability of efficiently maintaining large numbers of path faults to be simulated
Keywords :
circuit analysis computing; fault location; integrated circuit testing; many-valued logics; parallel processing; parallel processing; path delay fault simulation; patterns; Acceleration; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Parallel processing; Propagation delay; Robustness; Timing;
Journal_Title :
Computers, IEEE Transactions on