• DocumentCode
    895777
  • Title

    Techniques for a 5-V-only 64K EPROM based upon substrate hot-electron injection

  • Author

    McCreary, James L. ; Eitan, Boaz ; Amrany, Daniel

  • Volume
    19
  • Issue
    1
  • fYear
    1984
  • fDate
    2/1/1984 12:00:00 AM
  • Firstpage
    135
  • Lastpage
    143
  • Abstract
    A 5-V-only 64K EPROM has been developed, using an HMOS 1 EPROM technology, for the purpose of evaluating the substrate hot-electron (SHE) programming technique. The fully functional device contained all of the circuits normally found on a conventional 64K EPROM plus special circuits associated with the 5-V-only operation and with the SHE approach. The measured data demonstrated that a high injection efficiency was achieved, and that programming with low drain voltage (as low as 5 V) was possible. It was also shown that 5-V-only programming may be accomplished by using the on-chip high-voltage charge pumps, and that this is compatible with the SHE technique, The main disadvantage of the SHE approach (as measured from the device) was the low collection efficiency. This resulted in a programming rate of 1 V/ms. The greatest disadvantage of the SHE technique, as implemented on the test chip, was its complexity which complicated both design and evaluation and required a slightly larger die area.
  • Keywords
    Field effect integrated circuits; field effect integrated circuits; Channel hot electron injection; Circuit testing; DRAM chips; EPROM; Notice of Violation; Probes; Semiconductor device testing; Solid state circuits; Substrate hot electron injection; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1984.1052098
  • Filename
    1052098