• DocumentCode
    895781
  • Title

    A general mechanical model for |f|αspectral density random noise with special reference to flicker noise 1/|f|

  • Author

    Halford, Donald

  • Author_Institution
    National Bureau of Standards, Boulder, Colo.
  • Volume
    56
  • Issue
    3
  • fYear
    1968
  • fDate
    3/1/1968 12:00:00 AM
  • Firstpage
    251
  • Lastpage
    258
  • Abstract
    Any class of reasonable time-dependent perturbations occurring at random, under certain internal contraints, generates random noise having a spectral density varying as |f|αover an arbitrarily large range of spectral frequency f only for - 2 ≤ α ≤ 0. A class is the set of all perturbations which are equivalent under some individual indenpendent scaling of amplitute, scaling of time, and translation of time. A subclass is characterized by P(τ) and A2(τ). P(τ) is the lifetime probability desity. A2(τ) is a mean square amplitude of perturbations having lifetime τ. For a given class, |f|αand |f|α0are the frequency-smoothed laws in the limits of infinite and zero frequencies, respectively. Any reasonable perturbation has α≤ - 2 and α0≥ 0. To generate random noise having an |f|αlaw over an arbitrarily large range of f from a subclass chosen from any class characterized by αand α0, it is necessary that α≤ α ≤ α0. For α< α < α0, it is necessary and sufficient that such subclasses satisfy the condition, P(τ)A2(τ) ≈ Bτ- α - 3with B constant, over a suitable range of τ, and that P(τ)A2(τ) not be larger than Bτ- α - 3outside the range. This general mechanical model is of immediate value in the formulation and criticism of specific physical models of |f|αnoise, including flicker noise, and in computer simulation of |f|αnoise.
  • Keywords
    1f noise; Atomic measurements; Density measurement; Fluctuations; Frequency measurement; Measurement standards; NIST; Noise measurement; Oscillators; Semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1968.6269
  • Filename
    1448199