DocumentCode
895803
Title
An IC Compatible Ionizing Radiation Detector
Author
Dawes, W.R., Jr. ; Schwank, J.R.
Author_Institution
IC Technology Division, 2144
Volume
28
Issue
6
fYear
1981
Firstpage
4152
Lastpage
4155
Abstract
A new type of MOS ionization dosimetry device, which offers several major advantages over present detectors, is described. This device is fabricated using radiation-hardened CMOS processing technology, allowing integration of the ionization detector with radiation-hardened integrated circuits. The detector can be used as part of a circuit element which either switches state at a precisely controlled radiation level or provides an output voltage (or current) proportional to the total radiation dose. The radiation level at which the detector switches can be controlled either by a single precisely controlled process change, which also controls the rate of change of the output voltage versus irradiation level, or by an external bias. Dosimetry devices have been fabricated and tested under ionization radiation at levels from 5 Ã 103 to 5 Ã 105 rads (Si).
Keywords
CMOS integrated circuits; CMOS process; CMOS technology; Dosimetry; Integrated circuit technology; Ionization; Ionizing radiation; Radiation detectors; Switches; Voltage control;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335692
Filename
4335692
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