• DocumentCode
    895803
  • Title

    An IC Compatible Ionizing Radiation Detector

  • Author

    Dawes, W.R., Jr. ; Schwank, J.R.

  • Author_Institution
    IC Technology Division, 2144
  • Volume
    28
  • Issue
    6
  • fYear
    1981
  • Firstpage
    4152
  • Lastpage
    4155
  • Abstract
    A new type of MOS ionization dosimetry device, which offers several major advantages over present detectors, is described. This device is fabricated using radiation-hardened CMOS processing technology, allowing integration of the ionization detector with radiation-hardened integrated circuits. The detector can be used as part of a circuit element which either switches state at a precisely controlled radiation level or provides an output voltage (or current) proportional to the total radiation dose. The radiation level at which the detector switches can be controlled either by a single precisely controlled process change, which also controls the rate of change of the output voltage versus irradiation level, or by an external bias. Dosimetry devices have been fabricated and tested under ionization radiation at levels from 5 × 103 to 5 × 105 rads (Si).
  • Keywords
    CMOS integrated circuits; CMOS process; CMOS technology; Dosimetry; Integrated circuit technology; Ionization; Ionizing radiation; Radiation detectors; Switches; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4335692
  • Filename
    4335692