Title :
Employing a ground model to accurately characterize electronic devices measured with GSG probes
Author :
Jamneala, Tiberiu ; Bradley, Paul D. ; Feld, David A.
Author_Institution :
Integrated Circuit Design Group, Agilent Technol., San Jose, CA, USA
Abstract :
Traditionally, when measuring an electronic device, the nonideal (non-50 Ω) electrical behavior of the ground-signal-ground probes is removed through calibration. However, this procedure does not allow for an accurate measurement of devices that exhibit an unbalanced flow of electrical currents through the two ground fingers of the probe. We found that a simple interface circuit can be used by a circuit simulator, such as ADS, to reproduce the measurements of devices in which unbalanced ground currents flow in the return paths. A simple experimental method to determine the interface circuit is given.
Keywords :
calibration; inductance; measurement errors; microwave measurement; network analysers; probes; accurate measurement; calibration; circuit simulator; coplanar probe; electronic device measurement; ground circuit model; ground parasitic; ground path errors; ground-signal-ground probes; network analyzer; on-wafer measurement; return paths; simple interface circuit; single inductance parameter; unbalanced distribution; unbalanced ground currents; Calibration; Circuits; Current measurement; Electric variables measurement; Electronic equipment testing; Fingers; Measurement standards; Probes; Radio frequency; System testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2003.822028
