DocumentCode
895877
Title
An Organic FET SRAM With Back Gate to Increase Static Noise Margin and Its Application to Braille Sheet Display
Author
Takamiya, Makoto ; Sekitani, Tsuyoshi ; Kato, Yusaku ; Kawaguchi, Hiroshi ; Someya, Takao ; Sakurai, Takayasu
Author_Institution
VLSI Design & Educ. Center, Univ. of Tokyo
Volume
42
Issue
1
fYear
2007
Firstpage
93
Lastpage
100
Abstract
An integrated system of organic FETs (OFETs) and plastic actuators is proposed, and it is applied to a Braille sheet display. Some circuit technologies are presented to enhance the speed and the lifetime for the Braille sheet display. An OFET SRAM is developed to hide the slow transition of the actuators. Developed five-transistor SRAM cell reduces the number of the bit lines by one-half and reduces the SRAM cell area by 20%. Pipelining the write-operation reduced the SRAM write-time by 69%. Threshold voltage control technology using a back gate increased the static noise margin of SRAM and compensated for the chemical degradation of the OFETs after 15 days. The oscillation frequency tuning range from -82% to +13% in a five-stage ring oscillator is also demonstrated with the threshold voltage control technology. The overdrive techniques for the driver OFETs reduced the transition time of the actuator from 34 s to 2 s. These developed circuit technologies achieved the practical 1.75-s operation to change all 144 Braille dots on Braille sheet display and will be essential for the future large area electronics made with OFETs
Keywords
SRAM chips; actuators; display devices; field effect transistors; handicapped aids; oscillators; 1.75 sec; Braille sheet display; chemical degradation; five-stage ring oscillator; organic FET SRAM; organic field effect transistor; plastic actuators; static noise margin; threshold voltage control; write-operation; Actuators; Chemical technology; Circuits; Displays; FETs; OFETs; Plastics; Random access memory; Threshold voltage; Voltage control; Actuator; Braille; SRAM; large-area electronics; organic FET;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2006.886578
Filename
4039603
Link To Document