DocumentCode :
895889
Title :
A 56-nm CMOS 99-mm2 8-Gb Multi-Level NAND Flash Memory With 10-MB/s Program Throughput
Author :
Takeuchi, Ken ; Kameda, Yasushi ; Fujimura, Susumu ; Otake, Hiroyuki ; Hosono, Koji ; Shiga, Hitoshi ; Watanabe, Yoshihisa ; Futatsuyama, Takuya ; Shindo, Yoshihiko ; Kojima, Masatsugu ; Iwai, Makoto ; Shirakawa, Masanobu ; Ichige, Masayuki ; Hatakeyama,
Author_Institution :
Toshiba Corp., Yokohama
Volume :
42
Issue :
1
fYear :
2007
Firstpage :
219
Lastpage :
232
Abstract :
A single 3.3-V only, 8-Gb NAND flash memory with the smallest chip to date, 98.8 mm2, has been successfully developed. This is the world´s first integrated semiconductor chip fabricated with 56-nm CMOS technologies. The effective cell size including the select transistors is 0.0075 mum2 per bit, which is the smallest ever reported. To decrease the chip size, a very efficient floor plan with one-sided row decoder, one-sided page buffer, and one-sided pad is introduced. As a result, an excellent 70% cell area efficiency is realized. The program throughput is drastically improved to twice as large as previously reported and comparable to binary memories. The best ever 10-MB/s programming is realized by increasing the page size from 4kB to 8kB. In addition, noise cancellation circuits and the dual VDD-line scheme realize both a small die size and a fast programming. An external page copy achieves a fast 93-ms block copy, efficiently using a 1-MB block size
Keywords :
CMOS logic circuits; NAND circuits; flash memories; logic gates; 10 Mbits/s; 3.3 V; 4 kbit; 56 nm; 8 Gbit; 8 kbit; 93 ms; CMOS technologies; NAND flash memory; binary memories; high-speed programming; integrated semiconductor chip; multilevel cell; noise cancellation circuits; CMOS technology; Circuits; Costs; Decoding; Digital audio players; Digital cameras; Flash memory; Helium; Noise cancellation; Throughput; Flash memory; NAND flash memory; high-speed programming; multi-level cell;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2006.888299
Filename :
4039604
Link To Document :
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