• DocumentCode
    896003
  • Title

    Proposed Test Strategy for Radiation Hardened Custom LSI/VLSI

  • Author

    Spratt, J.P. ; Nickel, V.V. ; McCollum, G.L.

  • Author_Institution
    Questron Corporation El Segundo, CA
  • Volume
    28
  • Issue
    6
  • fYear
    1981
  • Firstpage
    4275
  • Lastpage
    4280
  • Keywords
    Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Large scale integration; Logic testing; Radiation hardening; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4335712
  • Filename
    4335712
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=896003