• DocumentCode
    896011
  • Title

    Properties of Microstrip Lines on Fused Quartz (Correspondence)

  • Author

    van Heuven, J.H.C. ; van Nie, A.G.

  • Volume
    18
  • Issue
    2
  • fYear
    1970
  • fDate
    2/1/1970 12:00:00 AM
  • Firstpage
    113
  • Lastpage
    114
  • Abstract
    The attenuation constant for microstrip lines on fused quartz and their effective relative dielectric constant were measured and the results are discussed. The propagation losses in these lines proved to be smaller than those mentioned in the literature. The effective relative dielectric constant is found to be independent of frequency up to 12 GHz. The conductors were deposited without an adhesive layer but with sufficient adhesion for pressure bonding semiconductor chips.
  • Keywords
    Attenuation; Conducting materials; Copper; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; Microstrip;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1970.1127164
  • Filename
    1127164
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=896011