DocumentCode
896062
Title
Predicting Lower Bounds on Failure Power Distributions of Silicon NPN Transistors
Author
Alexander, David R. ; Enlow, Ed W.
Author_Institution
Sandia National Laboratories Albuquerque, NM 87185 (505) 844-5163
Volume
28
Issue
6
fYear
1981
Firstpage
4305
Lastpage
4310
Keywords
Diffusion processes; Fabrication; Failure analysis; History; Manufacturing; Power distribution; Semiconductor device manufacture; Semiconductor device testing; Silicon; Topology;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335718
Filename
4335718
Link To Document