Title :
Specification of Bipolar LSI Device Input States for Latchup Testing
Author :
Erickson, J.J. ; Binder, D.
Author_Institution :
Hughes Aircraft Company Culver City, California 90230
Keywords :
Aircraft; Circuit testing; Cities and towns; Large scale integration; Latches; Logic circuits; Logic devices; Logic gates; Optical microscopy; Programmable logic arrays;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335722
