DocumentCode
896241
Title
Transient Effects of Ionizing Radiation in Photodiodes
Author
Wiczer, J.J. ; Dawson, L.R. ; Barnes, C.E.
Author_Institution
Sandia National Laboratories Albuquerque, New Mexico 87185
Volume
28
Issue
6
fYear
1981
Firstpage
4397
Lastpage
4402
Abstract
We report here on photodiode structures designed and fabricated to reduce the amplitude of unwanted, noise current induced during exposure to ionizing-radiation environments, without significantly reducing the desired photodiode signal current. For the optical wavelength range from .7 ¿m to 1.4 ¿m, we have studied three types of photodiode structures fabricated from AlGaAs, AlGaSb, and InGaAsP compound semiconductor materials. We also have tested and compared these specially fabricated, radiation insensitive photodiodes with commercially available photodiodes in an ionizing-radiation environment.
Keywords
Ionizing radiation; Noise level; Noise reduction; Optical noise; Photodiodes; Semiconductor device noise; Semiconductor materials; Signal design; Testing; Working environment noise;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335737
Filename
4335737
Link To Document