• DocumentCode
    896241
  • Title

    Transient Effects of Ionizing Radiation in Photodiodes

  • Author

    Wiczer, J.J. ; Dawson, L.R. ; Barnes, C.E.

  • Author_Institution
    Sandia National Laboratories Albuquerque, New Mexico 87185
  • Volume
    28
  • Issue
    6
  • fYear
    1981
  • Firstpage
    4397
  • Lastpage
    4402
  • Abstract
    We report here on photodiode structures designed and fabricated to reduce the amplitude of unwanted, noise current induced during exposure to ionizing-radiation environments, without significantly reducing the desired photodiode signal current. For the optical wavelength range from .7 ¿m to 1.4 ¿m, we have studied three types of photodiode structures fabricated from AlGaAs, AlGaSb, and InGaAsP compound semiconductor materials. We also have tested and compared these specially fabricated, radiation insensitive photodiodes with commercially available photodiodes in an ionizing-radiation environment.
  • Keywords
    Ionizing radiation; Noise level; Noise reduction; Optical noise; Photodiodes; Semiconductor device noise; Semiconductor materials; Signal design; Testing; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4335737
  • Filename
    4335737