Title :
Simulated Deep Source-Region EMP Coupling to Cylindrical Objects
Author :
Bushell, M. ; Manriquez, R. ; Merkel, G. ; Scharf, W.D.
Author_Institution :
US Army Electronics Research and Development Command Harry Diamond Laboratories Adelphi, MD 20783
Keywords :
Conductivity; Diodes; EMP radiation effects; Electromagnetic coupling; Electromagnetic fields; Electrons; Ionization; Maxwell equations; Research and development; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335747
