• DocumentCode
    896484
  • Title

    Dielectric Charging-The Effects of Straggling and Soft X-Ray Irradiation

  • Author

    Strickland, D.J. ; Beers, B.L. ; Pine, V.W.

  • Author_Institution
    Beers Associates, Inc. Post Office Box 2549 Reston, Virginia 22090
  • Volume
    28
  • Issue
    6
  • fYear
    1981
  • Firstpage
    4553
  • Lastpage
    4557
  • Abstract
    In this paper, we examine the charge distribution and electric field within a dielectric after it has been charged to saturation by an external kilovolt electron source and then irradiated by soft X-rays. We wish to know whether conditions exist for which soft X-ray irradiation can enhance the electric field in a precharged dielectric and thereby greatly enhance the likelihood of a discharge event. Van Lint et al. reported on discharge events observed on the Skynet satellite qualification model, one of which coincided with soft X-ray irradiation on the precharged satellite exterior. Mandell et al. have suggested a possible mechanism for such events involving surface flashover. We investigate a different mechanism which depends critically on the internal charge distribution and much less so on surface potential.
  • Keywords
    Charge measurement; Current measurement; Dielectric breakdown; Electron sources; Fault location; Flashover; Philosophical considerations; Qualifications; Satellites; Surface discharges;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4335763
  • Filename
    4335763