• DocumentCode
    8965
  • Title

    Reliability of 1310 nm Wafer Fused VCSELs

  • Author

    Sirbu, A. ; Suruceanu, G. ; Iakovlev, V. ; Mereuta, A. ; Mickovic, Z. ; Caliman, A. ; Kapon, Eli

  • Author_Institution
    Laboratory of Physics of Nanostructures, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
  • Volume
    25
  • Issue
    16
  • fYear
    2013
  • fDate
    Aug.15, 2013
  • Firstpage
    1555
  • Lastpage
    1558
  • Abstract
    Wafer fusion vertical cavity surface emitting laser (VCSEL) technology has produced devices that successfully passed all mechanical and electrical Telcordia qualification tests. Accelerated lifetime tests result in times to 1% failure at 70 ^{\\circ}{\\rm C} of 18 years and 30 years at VCSEL driving currents of 9 and 8 mA, respectively. These lifetimes meet the telecom industry reliability requirements for applications in fiber-optic communications networks.
  • Keywords
    Fiber optics; optical communication;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2013.2271041
  • Filename
    6547199
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=8965