Title :
RFI-induced distortion in switched-capacitor circuits
Author :
Crovetti, Paolo S. ; Fiori, Franco L.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
fDate :
4/1/2006 12:00:00 AM
Abstract :
The errors which are induced by radio-frequency interference (RFI) in switched-capacitor (SC) circuits are discussed and the main role played by the distortion of MOS switches in the on-state is highlighted. Furthermore, a new simple analytical model, which enables one to predict RFI-induced errors in SC circuits is proposed and it is validated by the comparison of its predictions with time-domain computer simulation results.
Keywords :
radiofrequency interference; switched capacitor networks; MOS switches; RFI-induced distortion; radio-frequency interference; switched-capacitor circuits; Clocks; Computer errors; MOS capacitors; Nonlinear distortion; Radio frequency; Radiofrequency interference; Switched capacitor circuits; Switches; Switching circuits; Voltage; Electromagnetic compatibility (EMC); electromagnetic interference (EMI); integrated circuits (ICs); nonlinear circuit analysis; sample and hold (SH); switched capacitors (SC);
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.861902
