DocumentCode :
8967
Title :
An Accurate Model for Finite Array Patterns Based on Floquet Modal Theory
Author :
Bhattacharyya, Arun K.
Author_Institution :
Northrop Grumman, Redondo Beach, CA, USA
Volume :
63
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
1040
Lastpage :
1047
Abstract :
An accurate model for obtaining the radiation patterns of a finite array is presented. Using Floquet modal theory, the induced electric and magnetic fields on the apertures of all the elements of the array produced by an excited element are determined. Equivalence principle is then invoked to obtain the active element pattern (AEP) of the excited element. The AEP is found to vary substantially with the location of the element. In particular, the E-plane pattern of an element near the edge has a tilted beam, which is conspicuously different from that of the center element. The beam-tilt is explained from the “reverse phase” of a leaky wave in an array. Numerical results compare well with available measured data for open-ended waveguide and patch arrays. Also, a rigorous method of moment (MoM) analysis agrees favorably with the present model. One of the key features of the model is that it allows array pattern computation without much additional computational efforts. From array analysis, it is observed that the null depth at the blind spot is reduced as the array size shrinks and for very small arrays, the blind spot disappears. The scan loss is found to vary significantly with the array size particularly near the blind spot.
Keywords :
active antenna arrays; antenna radiation patterns; aperture antennas; electric fields; leaky wave antennas; magnetic fields; method of moments; microstrip antenna arrays; AEP; E-plane pattern; Floquet modal theory; MoM analysis; active element pattern; electric field; equivalence principle; finite array antenna radiation pattern; leaky wave; magnetic field; method of moment; open-ended waveguide array; patch array; scan loss; Apertures; Arrays; Computational modeling; Electric fields; Finite element analysis; Manganese; Method of moments; Active element pattern; Active element pattern (AEP); Edge element pattern; Finite array; Floquet modes; Leaky wave; Mutual Coupling; Scan loss; edge element pattern; finite array; leaky wave; mutual coupling; scan loss;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2015.2389249
Filename :
7004804
Link To Document :
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