• DocumentCode
    896822
  • Title

    High-Performance On-Chip Transformers With Partial Polysilicon Patterned Ground Shields (PGS)

  • Author

    Lin, Yo-Sheng ; Chen, Chang-Zhi ; Liang, Hsiao-Bin ; Chen, Chi-Chen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chi Nan Univ., Puli
  • Volume
    54
  • Issue
    1
  • fYear
    2007
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    In this brief, we propose the concept of "partial patterned ground shields (PGSs)" to improve the performances of RF passive devices, such as inductors and transformers. Partial PGS can be achieved after the redundant PGS of a traditional complete PGS, which is right below the spiral metal lines of an RF passive device, is removed for the purpose of reducing the large parasitic capacitance. A set of test transformers has been implemented to demonstrate the partial PGS. The results show that when the partial PGS was adopted, a 56.5% (from 6.12 to 9.58) and a 55.7% (from 5.55 to 8.64) increase in Q-factor, an 18.2% (from 0.67 to 0.79) and a 21.4% (from 0.66 to 0.8) increase in maximum available power gain (GAmax), and an 18.4% (from 0.69 to 0.82) and a 21.2% (from 0.69 to 0.83) increase in magnetic-coupling factor (kim) were achieved at 4.2 and 5.2 GHz, respectively, for a bifilar transformer with an overall dimension of 230times215 mum2. Furthermore, compared with the transformer with traditional PGS, a 9.9% (from 10.1 to 11.1 GHz) increase in resonant frequency (fSR), a 38% (from 6.94 to 9.58) increase in Q-factor at 4.2 GHz, and a 5.3% (from 0.75 to 0.79) increase in GAmax at 4.2 GHz were obtained. These results demonstrate that the proposed partial PGS is very promising for high-performance RF-ICs applications
  • Keywords
    Q-factor; radiofrequency integrated circuits; transformers; 10.1 to 11.1 GHz; 215 micron; 230 micron; 4.2 GHz; 5.2 GHz; Q-factor; RF passive devices; RFIC; bifilar transformer; inductors; on-chip transformers; parasitic capacitance; partial polysilicon patterned ground shields; spiral metal lines; Electromagnetic coupling; Inductors; Parasitic capacitance; Q factor; Radio frequency; Radiofrequency integrated circuits; Silicon; Spirals; Testing; Transformers; Patterned ground shield (PGS); power gain; quality factor; radio-frequency integrated circuits (RFICs); transformer;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.887044
  • Filename
    4039700