Title :
Cosmic Ray Effects on Microelectronics
Author :
Adams, James H., Jr. ; Silberberg, Rein ; Tsao, C.H.
Author_Institution :
Laboratory for Cosmic Ray Physics Naval Research Laboratory Washington, D. C. 20375
Keywords :
Circuits; Cosmic rays; Earth; Frequency estimation; Helium; Hydrogen; Iron; Laboratories; Microelectronics; Protons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4335821
