• DocumentCode
    897120
  • Title

    Numerical modeling of the spatial and spectro-temporal behavior of wide-aperture unstable resonator semiconductor lasers

  • Author

    Chelnokov, A.V. ; Lourtioz, J.M. ; Gavrilovic, P.

  • Author_Institution
    Inst. d´´Electron. Fondamentale, Univ. de Paris-Sud, Orsay, France
  • Volume
    7
  • Issue
    8
  • fYear
    1995
  • Firstpage
    863
  • Lastpage
    865
  • Abstract
    We propose a numerical model adapted to the analysis of the (sub)picosecond dynamics of broad area semiconductor optical systems with a simultaneous description of the 2-D spatial and spectral behaviors. The model combines the advantages of the beam propagation method and time-domain method and treats the 2-D spatial inhomogeneities of the laser structure as well as the gain nonlinearities, the finite gain bandwidth, the presence of grating reflectors and the optical index dependence on carrier concentration. The model is applied to simulate the transient response of a DBR unstable cavity laser under current step excitation. The CW regime is calculated as a limit of the dynamic one.<>
  • Keywords
    distributed Bragg reflector lasers; high-speed optical techniques; laser cavity resonators; laser stability; semiconductor lasers; time-domain analysis; 2-D spatial inhomogeneities; CW regime; DBR unstable cavity laser; beam propagation method; broad area semiconductor optical systems; carrier concentration; current step excitation; finite gain bandwidth; gain nonlinearities; grating reflectors; laser structure; numerical model; optical index dependence; picosecond dynamics; spatial behavior; spectro-temporal behavior; subpicosecond dynamics; time-domain method; transient response; wide-aperture unstable resonator semiconductor lasers; Bandwidth; Distributed Bragg reflectors; Gratings; Laser beams; Laser modes; Numerical models; Optical propagation; Semiconductor lasers; Time domain analysis; Transient response;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.403996
  • Filename
    403996