DocumentCode :
897865
Title :
Hot-Electron Substrate-Current Generation During Switching Transients
Author :
Hsu, Fu-Chieh ; Chiu, Kuang Yi
Volume :
20
Issue :
1
fYear :
1985
fDate :
2/1/1985 12:00:00 AM
Firstpage :
314
Lastpage :
319
Abstract :
The characteristics of hot-electron substrate-current generation in n-channel MOSFET´s during switching transients of an inverter are studied. The amount of substrate current generated depends strongly on the loading and the input transition time (switching speed) of the inverter. Most circuit elements including inverters, source followers, and transfer gates have similar behaviors in transient substrate-current generation. An analytical model is proposed to calculate the substrate-current generation with various supply voltages and input transition times. This model not only establishes the relationship between dc and transient substrate-current measurements, but also serves as a useful tool in predicting circuit/device reliability during actual circuit operations.
Keywords :
Field effect integrated circuits; Hot carriers; Insulated gate field effect transistors; Invertors; Large scale integration; Reliability; Semiconductor device models; Transients; Analytical models; Character generation; DC generators; Degradation; Electric breakdown; Inverters; MOSFET circuits; Predictive models; Random access memory; Threshold voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1985.1052308
Filename :
1052308
Link To Document :
بازگشت