DocumentCode
898366
Title
Totally Depleted Surface Barrier Detectors Made of Ultra-High Purity P-Type Silicon Crystals
Author
Shiraishi, F. ; Hosoe, M. ; Takami, Y. ; Ohsawa, Y.
Author_Institution
Institute for Atomic Energy, Rikkyo University Nagasaka, Yokosuka, Kanagawa, 240-01, Japan
Volume
29
Issue
1
fYear
1982
Firstpage
775
Lastpage
778
Abstract
Thick Surface Barrier Detectors were developed using new ultra-high-resisitivity (~100K¿·cm) p-type Si crystals, which were crystalized from monosilane gas, after being purified through molecular sieves. The detectors have vacuum evaporated electrodes of Al on a surface and of Au on another, and their thickness are 12-13 mm. It was confirmed through this work, surface treatment to generate an accumulation layer to the Au side improved the charge collection. The fabrication procedures and performances of the detectors are discussed.
Keywords
Crystals; Detectors; Electrodes; Fabrication; Gold; Impurities; Molecular sieves; Purification; Silicon; Surface treatment;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1982.4335956
Filename
4335956
Link To Document