DocumentCode :
898375
Title :
Epitaxial Integrated E-dE Position Sensitive Silicon Detectors
Author :
Kim, C. ; Kikuchi, K. ; Husimi, K. ; Ohkawa, S. ; Saito, I.
Author_Institution :
Department of Electronics Engineering, Korea University, Kodaira, Tokyo 187, Japan
Volume :
29
Issue :
1
fYear :
1982
Firstpage :
779
Lastpage :
781
Abstract :
The epitaxial integrated E-dE position sensitive silicon detector has been developed as an extension of the epitaxial integrated E-dE silicon detector. The charge dividing resistor is produced by evaporation of Pd on the E side of the detector. This Pd evaporated layer acts as the surface barrier electrode of the E detector. The good position sensing characteristics will be expected by using the charge dividing resistor made of a P-type epitaxial silicon layer grown on the substrate instead of the evaporated Pd layer.
Keywords :
Capacitance; Degradation; Electrical resistance measurement; Electrodes; Gas detectors; Position sensitive particle detectors; Resistors; Silicon; Substrates; Surface resistance;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1982.4335957
Filename :
4335957
Link To Document :
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