• DocumentCode
    8985
  • Title

    Single-Mode Vertical Cavity Surface Emitting Laser via Oxide-Aperture-Engineering of Leakage of High-Order Transverse Modes

  • Author

    Shchukin, Vitaly ; Ledentsov, Nikolay N. ; Kropp, Joerg ; Steinle, Gunter ; Ledentsov, Nikolay ; Burger, Stefan ; Schmidt, F.

  • Author_Institution
    VI Syst. GmbH, Berlin, Germany
  • Volume
    50
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    990
  • Lastpage
    995
  • Abstract
    Properly designed oxide-confined vertical cavity surface emitting laser (VCSEL) allows leakage of the optical modes from the all-semiconductor core region to the selectively oxidized periphery if the orthogonality between the core mode and the modes on the periphery is broken by the oxidation-induced optical field redistribution. The leakage losses are stronger for high-order transverse modes, which have a higher field intensity close to the oxidized region. Single mode lasing in the fundamental mode can thus proceed up to large aperture diameters. The 850-nm GaAlAs thick oxide aperture VCSEL based on this concept is designed, modeled, and fabricated, showing single-mode lasing with the aperture diameters up to 5 μm. Side mode suppression ratio >20 dB is realized at the current density of ~10KA/Cm2 in devices with the series resistance of 90 Ω.
  • Keywords
    aluminium compounds; gallium compounds; laser cavity resonators; laser modes; optical design techniques; optical fabrication; optical losses; oxidation; surface emitting lasers; GaAlAs; VCSEL; all-semiconductor core region; current density; high-order transverse modes leakage; leakage losses; optical modes; oxidation-induced optical field redistribution; oxide-aperture-engineering; resistance 90 ohm; series resistance; side mode suppression ratio; single-mode lasing; single-mode vertical cavity surface emitting laser; wavelength 850 nm; Apertures; Cavity resonators; Distributed Bragg reflectors; Optical refraction; Optical variables control; Vertical cavity surface emitting lasers; Single mode VCSEL; leakage losses; oxide aperture;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2014.2364544
  • Filename
    6934972